LA CLAVE EN SUS IDEAS DE PRUEBA Y MEDICIÓN

This is an Echelle Spectrometer designed for diffraction limit operation, that provides a full spectrum coverage without gaps over a tunable 150nm range at a resolution of ~2pm in single pass mode. The spectrometer uses two gratings, two 1.5m f.l. parabolic reflectors and a corrector lens to produce a cross-dispersed echellegram that is recorded on a 3k x 3k cooled CCD camera with 12u pixels, at a dispersion of 1 pm/pixel. The long, thin echellegram is fit to the square CCD format using a 3 section image slicer, to maximize wavelength coverage and resolution.Input optics include a micrometer adjustable rectangular input slit and a computer controlled source selector that can switch between four available input ports, useful in calibration.Operational specifications are (for 31.5 l/mm 150x50 mm echelle, single pass)* Dispersion: 1pm/pixel; (diffraction limit = 1pm)* Wavelength coverage: 150nm band, position continuously selectable.No gap coverage up to 800nm. Camera coverage 300nm-900nm.* Aperture f/25.* Input slit: rectangular, continuously adjustable 0-500um.* Source selector to switch between four inputs.* Calibration facilities for wavelength and intensity.* Software to transfer raw images to permanent storage at the maximum possible rate, to transform and store as spectra corrected for wavelength & intensity.Please note that for full frame digitization at 12 bits the transfer rate is 10seconds per frame. Smaller frame sections can be transferred at correspondingly faster rates.